Faculté des Sciences appliquées
Faculté des Sciences appliquées
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Automated spike analysis for IC production testing solutions

Javaux, Maxime ULiège
Promotor(s) : Vanderbemden, Philippe ULiège
Date of defense : 27-Jun-2016/28-Jun-2016 • Permalink :
Title : Automated spike analysis for IC production testing solutions
Author : Javaux, Maxime ULiège
Date of defense  : 27-Jun-2016/28-Jun-2016
Advisor(s) : Vanderbemden, Philippe ULiège
Committee's member(s) : Vanderheyden, Benoît ULiège
Kraft, Michael ULiège
Mauroo, Yven 
Language : English
Number of pages : 94
Keywords : [en] Automated
[en] spike
[en] test
[en] Melexis
[en] High frequency
Discipline(s) : Engineering, computing & technology > Electrical & electronics engineering
Commentary : Thesis realized in Melexis, Tessenderlo site.
Institution(s) : Université de Liège, Liège, Belgique
Degree: Master en ingénieur civil électricien, à finalité approfondie
Faculty: Master thesis of the Faculté des Sciences appliquées


[en] When a semiconductor company delivers a component to a customer, this component has to work perfectly. A series of tests is carried out at the end of the production line to ensure that the final product is not flawed.

One takes care of potential damages that can be caused to the component during testing. Undesirable high frequency voltage spikes can damage the component during the test sequence. These have to be detected during the validation of the test sequence and suppressed.

In this document, two main goals are developed. First, the design and the creation of an automated way of testing a sequence of tests to ensure that no spikes are submitted to the tested component. Secondly, the research and the implementation of an automated way of spike source localization to support the test engineer.

To reach the first goal of the thesis, several high frequency PCBs as well as an acquisition program controlling a PC-based oscilloscope were designed and created. To reach the second goal of the thesis, a mechanism was conceived to synchronize the test equipment via TCP/IP with the computer that runs the acquisition program.

Finally, the tool created in the framework of this master thesis is able to detect spikes and localize tests that produces these spikes, allowing the test engineer to work more efficiently. A job that lasted, initially, days or weeks can now be accomplished within hours.



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  • Javaux, Maxime ULiège Université de Liège > Master ingé. civ. électr., fin. appr. (ex 2e master)


Committee's member(s)

  • Vanderheyden, Benoît ULiège Université de Liège - ULg > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Electronique et microsystèmes
    ORBi View his publications on ORBi
  • Kraft, Michael ULiège Université de Liège - ULg > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Systèmes microélectroniques intégrés
    ORBi View his publications on ORBi
  • Mauroo, Yven Transportstraat 1, 3980 Tessenderlo
  • Total number of views 132
  • Total number of downloads 1203

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