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Faculté des Sciences appliquées
Faculté des Sciences appliquées
MASTER THESIS
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Electromigration-driven weak resistance switching in high-temperature superconducting devices

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Stoffels, Daniel ULiège
Promotor(s) : Silhanek, Alejandro ULiège
Date of defense : 24-Jun-2024/25-Jun-2024 • Permalink : http://hdl.handle.net/2268.2/20362
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Title : Electromigration-driven weak resistance switching in high-temperature superconducting devices
Translated title : [fr] Faible commutation de résistance induite par électromigration dans les dispositifs supraconducteurs à haute température
Author : Stoffels, Daniel ULiège
Date of defense  : 24-Jun-2024/25-Jun-2024
Advisor(s) : Silhanek, Alejandro ULiège
Committee's member(s) : Vanderheyden, Benoît ULiège
Gilet, Tristan ULiège
Language : English
Number of pages : 83
Keywords : [en] electromigration
[en] resistive switching
[en] YBCO
Discipline(s) : Engineering, computing & technology > Materials science & engineering
Research unit : Experimental Physics of Nanostructured Materials, Q-MAT, Université de Liège, Belgium
Target public : Researchers
Professionals of domain
Student
Institution(s) : Université de Liège, Liège, Belgique
Degree: Master en ingénieur civil physicien, à finalité approfondie
Faculty: Master thesis of the Faculté des Sciences appliquées

Abstract

[en] Complex oxides are at the heart of modern functional material developments. In particular, the perovskite ABO3 structure is seen in compounds used in oxide solar cells, resistive memories, fuel cell catalysts, superconducting tapes, quantum bits and programmable magnets, making it one of the most studied material families. One important advantage of these systems is that their properties may be controlled in situ to change between various electronic states, usually by means of thermal or electric conditioning. In this work, we investigate the two-terminal resistive switching properties of the perovskite-like oxide YBa2Cu3O7-δ when the system is driven by electric current. We perform all-electrical switching to characterize and control low-amplitude resistance changes, and we implement finite element modeling to explain how these effects can be properly accounted for by oxygen-vacancy counterflow induced by electric bias. The presented research sheds new light on the bulk displacement of oxygen atoms in perovskite materials with potential for sensing and memory technologies.


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Author

  • Stoffels, Daniel ULiège Université de Liège > Master ing. civ. phys., fin. approf.

Promotor(s)

Committee's member(s)

  • Vanderheyden, Benoît ULiège Université de Liège - ULiège > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Electronique et microsystèmes
    ORBi View his publications on ORBi
  • Gilet, Tristan ULiège Université de Liège - ULiège > Département d'aérospatiale et mécanique > Microfluidique
    ORBi View his publications on ORBi
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